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Array PoP Test Image

Array PoP Test

Designed with the benefit of a variety of verification tools to ensure simultaneous engagement and alignment to both sides of the package.

Peripheral Strip Test Image

Peripheral Strip Test

Highly reliable multi site strip test socket . Customized design to suite any strip test handler.

Volta Series Probe Head Image

Volta Series Probe Head

High performance, cost-effective, easily maintainable alternative to cantilever and vertical probe card technologies.

Thermal Management Lid Capabilities Image

Thermal Management Lid Capabilities

Thermal Management Lid solutions are high value variations, including air-chilled or liquid cooled technology, capable of dissipating up to 650 Watts.

Galileo Test Socket Image

Galileo Test Socket

Innovative, low-profile test socket that provides outstanding electrical and mechanical performance for IC test customers who need a cost effective, rapid delivery solution.

Kelvin Probes Solution Image

Kelvin Probes Solution

Unique chisel tip provides reliable, stable contact resistance for critical applications such as loT, automotive where test performance cannot be sacrificed.

Q-Series H-Pin® Socket Image

Q-Series H-Pin® Socket

Available for mid to large package sizes with a fully molded socket body and lid designed to meet the rigors of a wide variety of accelerated life testing applications.