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Array PoP Test
Designed with the benefit of a variety of verification tools to ensure simultaneous engagement and alignment to both sides of the package.
Array High Speed Test - DaVinci Series
Innovative IM material to permit a truly coaxial structure from tip to tip allowing for industry leading yields in a highly compliant contactor.
Standard Array & Peripheral Test
Customized test sockets for any IC packages. Suitable for lab, Engineering, SLT & ATE test applications.
Peripheral Strip Test
Highly reliable multi site strip test socket . Customized design to suite any strip test handler.
Peripheral Tri-Temp Test
Celsius test sockets feature a wiping contact technology perfect for QFN testing.
Volta Series Probe Head
High performance, cost-effective, easily maintainable alternative to cantilever and vertical probe card technologies.
Thermal Management Lid Capabilities
Thermal Management Lid solutions are high value variations, including air-chilled or liquid cooled technology, capable of dissipating up to 650 Watts.
Galileo Test Socket
Innovative, low-profile test socket that provides outstanding electrical and mechanical performance for IC test customers who need a cost effective, rapid delivery solution.
Kelvin Probes Solution
Unique chisel tip provides reliable, stable contact resistance for critical applications such as loT, automotive where test performance cannot be sacrificed.
Array High Speed Test - DaVinci Micro Test Socket
Fully shielded signal path negates the effects of cross-talk during test, allowing an immediate yield enhancement.
Array High Speed Test - DaVinci 112
DaVinci 112 increases production yields and throughput, eliminating false faults and complete functional failures.
Q-Series H-Pin® Socket
Available for mid to large package sizes with a fully molded socket body and lid designed to meet the rigors of a wide variety of accelerated life testing applications.