The unique precision afforded by Smiths Interconnect's floating spring probe designs allows for seamless deployment in testing Wafer Level Chip Scale Packages. We work closely with our customers to develop contactors which are used as probe heads in place of cantilever and traditional vertical probe card technologies. Smiths Interconnect has created thousands of probe heads for every type of device and prober. In that process, we have created a WLCSP-optimized family of spring contact probes, the Volta Series.
- Reliable RF signal integrity
- Excellent compliance and contact force
- Easy maintenance
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Volta 180 | Volta 200 | Volta 250 | Volta 300 | Volta 350 | Volta 400 | ||
---|---|---|---|---|---|---|---|
Wafer I/O Pitch | 180 μm | 200 μm | 250 μm | 300 μm | 350 μm | 400 μm | |
Minimum Probe Depth (At Test) |
2.85 mm | 2.85 mm | 2.90 mm | 3.80 mm | 3.50 mm | 2.90 mm | |
Probe Travel | Wafer Side | 230 μm | 230 μm | 250 μm | 250 μm | 300 μm | 300 μm |
PCB Side | 170 μm | 170 μm | 150 μm | 150 μm | 150 μm | 150 μm | |
Spring Material | music wire | music wire | music wire | stainless steel | stainless steel | stainless steel | |
Device Side Contact Material | Homogenous | ||||||
Probe Tip Shape | 4-Point Crown | ||||||
Spring Force | 6.5 gf | 10 gf | 15 gf | 17.5 gf | 16 gf | 17 gf | |
Contact Resistance | < 200 mΩ | < 250 mΩ | < 100 mΩ | < 100 mΩ | < 70 mΩ | < 50 mΩ | |
Continuous Current Carrying Capacity (Room Temp.) | 0.84 A | 1.2 A | 1.5 A | 2 A | 2.50 A | 3 A | |
Insertion Loss (Pattern: R-S-R @ -1 dB) |
20 GHz | 22 GHz | 30 GHz | 20 GHz | 20 GHz | 20 GHz | |
Loop Inductance | 0.65 nH | 0.56 nH | 0.76 nH | 0.95 nH | 0.92 nH | 0.82 nH | |
Capacitance | 0.40 pF | 0.22 pF | 0.31 pF | 0.39 pF | 0.41 pF | 0.30 pF | |
Working Temperature | -55° to120°C | -55° to 120°C | -55° to 120°C | -55° to 150°C | -55° to 150°C | -55° to 150°C | |
Max. Number of Test Sites | Defined by the FEA [Total pin count at a defined area is the limit] | ||||||
Sorted Die Test Feature (Alignment Plate and Manual Actuator) | Yes | ||||||
Individual Contact Replacement | Yes |